Aufsatz
Threshold scan of the Ne 2s-electron photoionization cross edition
Zusammenfassung
The photoionization of the Ne 2s-electrons was studied from threshold to 1 eV above threshold. The technique of photon-induced fluorescence spectroscopy was applied. Pronounced structures were observed resulting from autoionization of doubly excited atomic states. A threshold cross section of 0.17 Mb was determined.
Zitierform
In: Physics letters / A. Amsterdam : North-Holland Publ. Vol. 169 (1990), S. 393-395Sammlung(en)
Publikationen (Experimentalphysik IV - Funktionale dünne Schichten & Physik mit Synchrotronstrahlung)Zitieren
@article{urn:nbn:de:hebis:34-2008070822639,
author={Schartner, K.-H. and Möbus, B. and Mentzel, G. and Ehresmann, Arno and Vollweiler, F. and Schmoranzer, H.},
title={Threshold scan of the Ne 2s-electron photoionization cross edition},
year={1990}
}
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2008-07-08T10:07:58Z 2008-07-08T10:07:58Z 1990 0375-9601 0031-9163 urn:nbn:de:hebis:34-2008070822639 http://hdl.handle.net/123456789/2008070822639 201037 bytes application/pdf eng Urheberrechtlich geschützt https://rightsstatements.org/page/InC/1.0/ 530 Threshold scan of the Ne 2s-electron photoionization cross edition Aufsatz The photoionization of the Ne 2s-electrons was studied from threshold to 1 eV above threshold. The technique of photon-induced fluorescence spectroscopy was applied. Pronounced structures were observed resulting from autoionization of doubly excited atomic states. A threshold cross section of 0.17 Mb was determined. open access In: Physics letters / A. Amsterdam : North-Holland Publ. Vol. 169 (1990), S. 393-395 Schartner, K.-H. Möbus, B. Mentzel, G. Ehresmann, Arno Vollweiler, F. Schmoranzer, H. Extern
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