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dc.date.accessioned2008-07-08T10:07:58Z
dc.date.available2008-07-08T10:07:58Z
dc.date.issued1990
dc.identifier.issn0375-9601
dc.identifier.issn0031-9163
dc.identifier.uriurn:nbn:de:hebis:34-2008070822639
dc.identifier.urihttp://hdl.handle.net/123456789/2008070822639
dc.format.extent201037 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.rightsUrheberrechtlich geschützt
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/
dc.subject.ddc530
dc.titleThreshold scan of the Ne 2s-electron photoionization cross editioneng
dc.typeAufsatz
dcterms.abstractThe photoionization of the Ne 2s-electrons was studied from threshold to 1 eV above threshold. The technique of photon-induced fluorescence spectroscopy was applied. Pronounced structures were observed resulting from autoionization of doubly excited atomic states. A threshold cross section of 0.17 Mb was determined.eng
dcterms.accessRightsopen access
dcterms.bibliographicCitationIn: Physics letters / A. Amsterdam : North-Holland Publ. Vol. 169 (1990), S. 393-395
dcterms.creatorSchartner, K.-H.
dcterms.creatorMöbus, B.
dcterms.creatorMentzel, G.
dcterms.creatorEhresmann, Arno
dcterms.creatorVollweiler, F.
dcterms.creatorSchmoranzer, H.
dc.description.etExtern


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