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dc.date.accessioned2013-10-31T08:51:50Z
dc.date.available2013-10-31T08:51:50Z
dc.date.issued2013
dc.identifier.issn1089-7550
dc.identifier.otherzdb:ZDB-1-AIPK
dc.identifier.uriurn:nbn:de:hebis:34-2013103144399
dc.identifier.urihttp://hdl.handle.net/123456789/2013103144399
dc.subject.ddc530
dc.titleExchange bias in thin Heusler alloy films in contact with antiferromagneteng
dc.typeAufsatz
dcterms.accessRightsopen access
dcterms.bibliographicCitationIn: Journal of applied physics. - Melville, NY : American Inst. of Physics, 2013, Vol. 113, 193907, 1-4
dcterms.creatorDubowik, J.
dcterms.creatorGościańska, I.
dcterms.creatorZałȩski, K.
dcterms.creatorGłowiński, H.
dcterms.creatorKudryavtsev, Y.
dcterms.creatorEhresmann, A.
dc.description.everythingDieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich. - This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively.ger
dc.relation.doidoi:10.1063/1.4807167


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