2013-10-312013-10-3120111089-7550zdb:ZDB-1-AIPKurn:nbn:de:hebis:34-2013103144353http://hdl.handle.net/123456789/2013103144353engUrheberrechtlich geschützthttps://rightsstatements.org/page/InC/1.0/530Thermal exchange bias field drift in field cooled Mn_83Ir_17/Co_70Fe_30 thin films after 10 keV He ion bombardmentAufsatz