2023-08-022023-08-022022-01-29http://hdl.handle.net/123456789/14967engNamensnennung 4.0 Internationalhttp://creativecommons.org/licenses/by/4.0/nanocrystalline metalthin filmsfatigueelectrical resistivitythrough-thickness cracks620660Linking through-thickness cracks in metallic thin films to in-situ electrical resistance peak broadeningAufsatzNanostrukturiertes MaterialDünne SchichtMaterialermüdungWiderstand <Elektrotechnik>Riss