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2018Subject
620 Engineering FotovoltaikanlageWechselrichterIGBTSiliciumbauelementKosmische StrahlungSingle Event EffectThermische BelastungSpannungsabhängigkeitZuverlässigkeitLebensdauerMetadata
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Investigation of Reliability Aspects of Power Semiconductors in Photovoltaic Central Inverters for Sunbelt Regions
Abstract
High reliability and system lifetimes in the range of 30 years are essential for renewable energy systems such as photovoltaic power plants to minimise costs for the generated electric energy. At the same time such systems are used in regions with high solar irradiance and also harsh environmental conditions. Therefore, designs for photovoltaic inverters need to meet not only the key design criteria of high conversion efficiency but also need to be very robust and at the same time meet challenging cost targets. In this dissertation aspects concerning the lifetime and reliability of power semiconductors in photovoltaic central inverters are investigated. On key topic of the dissertation is the measurement of the voltage dependent failure rate due to cosmic radiation induced single-event-burnout of SiC and Si power semiconductors. The second topic is the development of a system level simulation to quantify the stress on the power semiconductors in a PV central inverters in various regions of the world. Further topics are the investigation of improved control concepts for the cooling system of PV central inverters and the monitoring of IGBT temperatures during converter operation.
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Zugleich: Dissertation, Universität Kassel, 2018Druckausgabe
Link zu kassel university pressCitation
@book{doi:10.19211/kup9783737604956,
urn:nbn:de:0002-404959,
author={Felgemacher, Christian Jochen},
title={Investigation of Reliability Aspects of Power Semiconductors in Photovoltaic Central Inverters for Sunbelt Regions},
publisher={kassel university press},
year={2018}
}
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2023-04-21T16:39:37Z 2023-04-21T16:39:37Z 2018 doi:10.19211/kup9783737604956 978-3-7376-0495-6 (e-book) urn:nbn:de:0002-404959 http://hdl.handle.net/123456789/14620 Zugleich: Dissertation, Universität Kassel, 2018 eng kassel university press Urheberrechtlich geschützt https://rightsstatements.org/page/InC/1.0/ 620 Investigation of Reliability Aspects of Power Semiconductors in Photovoltaic Central Inverters for Sunbelt Regions Buch High reliability and system lifetimes in the range of 30 years are essential for renewable energy systems such as photovoltaic power plants to minimise costs for the generated electric energy. At the same time such systems are used in regions with high solar irradiance and also harsh environmental conditions. Therefore, designs for photovoltaic inverters need to meet not only the key design criteria of high conversion efficiency but also need to be very robust and at the same time meet challenging cost targets. In this dissertation aspects concerning the lifetime and reliability of power semiconductors in photovoltaic central inverters are investigated. On key topic of the dissertation is the measurement of the voltage dependent failure rate due to cosmic radiation induced single-event-burnout of SiC and Si power semiconductors. The second topic is the development of a system level simulation to quantify the stress on the power semiconductors in a PV central inverters in various regions of the world. Further topics are the investigation of improved control concepts for the cooling system of PV central inverters and the monitoring of IGBT temperatures during converter operation. open access Felgemacher, Christian Jochen 2018-01-30 xv, 165 Seiten Kassel, Universität Kassel, Fachbereich Elektrotechnik / Informatik Zacharias, Peter (Prof. Dr.) Liserre, Marco (Prof. Dr.) Kassel 978-3-7376-0494-9 (print) Fotovoltaikanlage Wechselrichter IGBT Siliciumbauelement Kosmische Strahlung Single Event Effect Thermische Belastung Spannungsabhängigkeit Zuverlässigkeit Lebensdauer publishedVersion Elektrische Energiesysteme Band 15 true 39,00 Elektrische Energiesysteme Naturwissenschaft, Technik, Informatik, Medizin Dissertation FB 16 / Elektrotechnik / Informatik true Softcover DIN A5
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