Aufsatz
Thermal exchange bias field drifts after 10 keV He ion bombardment
(Storage temperature dependence and initial number of coupling sites)
Citation
In: Journal of applied physics. - Melville, NY : American Inst. of Physics, 2011, Vol. 110, 113911, 1-4Collections
Publikationen (Experimentalphysik IV - Funktionale dünne Schichten & Physik mit Synchrotronstrahlung)Citation
@article{urn:nbn:de:hebis:34-2013103144365,
author={Schmidt, Christoph and Weis, Tanja and Engel, Dieter and Ehresmann, Arno},
title={Thermal exchange bias field drifts after 10 keV He ion bombardment},
year={2011}
}
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2013-10-31T07:54:21Z 2013-10-31T07:54:21Z 2011 1089-7550 zdb:ZDB-1-AIPK urn:nbn:de:hebis:34-2013103144365 http://hdl.handle.net/123456789/2013103144365 eng Urheberrechtlich geschützt https://rightsstatements.org/page/InC/1.0/ 530 Thermal exchange bias field drifts after 10 keV He ion bombardment Aufsatz open access Storage temperature dependence and initial number of coupling sites In: Journal of applied physics. - Melville, NY : American Inst. of Physics, 2011, Vol. 110, 113911, 1-4 Schmidt, Christoph Weis, Tanja Engel, Dieter Ehresmann, Arno Dieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich. - This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively. doi:10.1063/1.3665198
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